Product Detail

Model WCT-120 - Standard Offline Wafer-Lifetime Tool

The wafer measurement instrument offering the best available calibrated analysis of carrier recombination lifetime. Fully compliant with SEMI Standard PV-13.WCT-120 instruments showcase our unique measurement and analysis techniques, including the highly regarded Quasi-Steady-State Photoconductance (QSSPC) lifetime measurement method developed by Sinton Instruments in 1994.The QSSPC technique is ideal for monitoring multicrystalline wafers, dopant diffusions, and low-lifetime samples. This method complements the use of the transient photoconductance technique that is also standard on this instrument.The QSSPC lifetime measurement also yields the implied open-circuit voltage (versus illumination) curve, which is comparable to an l-V curve at each stage of a solar cell process.

 WCT System Capabilities

Primary application:Step-by-step monitoring and optimization of a fabrication process.

 Other Applications

• Monitoring initial material quality
• Detecting heavy metals contamination during wafer processing
• Evaluating surface passivation and emitter dopant diffusion
• Evaluating process-induced shunting using the implied I-V measurement